Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Canelas, Ant�nio Manuel Louren�o
3030415384
ISBN 13: 9783030415389
Softcover

Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

79
ING9783030415389
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1. Introduction2. Analog IC Sizing Background3. Yield Estimation Techniques Related Work4. Monte Carlo-Based Yield Estimation New Methodology5. AIDA-C Variation-Aware Circuit Synthesis Tool6. Tests & Results7. Conclusion and Future WorkIndex

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