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Author Name:    Sadewasser, Sascha

Title:   Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences)

Binding:   Hardcover

Book Condition:   New

Publisher:    Springer 

ISBN Number:   3642225659 / 9783642225659

Seller ID:   ING9783642225659

3642225659 Special order direct from the distributor

More Description

Overthe nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.



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